Reviewer

Tao Jun, The han river university, China
Wang Xuan, Chongqing Academy of Metrology and Quality Inspection, China
John Joshua F. Montañez, Bicol State College of Applied Sciences and Technology, Philippines
Mingliang Gao, Shandong University of Technolgoy, China
Yang Xihan,Chongqing Academy of Metrology and Quality Inspection, China
Xiaojie Liu, Northeastern University, China
Wang Xuan, Chongqing Academy of Metrology and Quality Inspection, China
Syed Agha Hassnain Mohsan, Zhejiang University, China
Guofeng Zou, Shandong University of Technology, China
Zifei Liang, New York University, US
Nabakrushna Sabat, Electronics & Communication Engineering Department, National Institute of Technology, India
Serestina Viriri, Dean and Head of School, University of KwaZulu-Natal, South Africa
Heming Cui, The University of Hong Kong (HKU), China
Phakkharawat Sittiprapaporn, School of Anti-Aging and Regenerative Medicine, Mae Fah Luang University, Thailand
Dang Xuan Kien, HoChiMinh City University of Transport, Viet Nam
Huang Boling, Chongqing Academy of Metrology and Quality Inspection, China
Chia Kim Seng, Universiti Tun Hussein Onn Malaysia, Malaysia
Defu Cao, University of Southern California, US
Alessandro Bruno, Department of Computing and Informatics, Bournemouth University, UK
Qilei (Kevin) Li, Queen Mary University of London, UK
Hamid Esmaeili Najafabadi, University of Calgary, Canada
Shamganth Kumarapandian, Department of Engineering, University of Technology and Applied Sciences, Sultanate of Oman
Chaohui Zhang, Beijing Jiaotong University, China
Tian Soon Lee, Multimedia University, Malaysia
Jing Guo, Xi'an Jiaotong University, China
Minfan Li, National Taiwan University of Science and Technology, China
Rabia Nazir, University of Engineering & Technology, Pakistan
Nishant Patnaik, Anil Neerukonda Institute of Technology and Sciences, India
Gang Wang, School of Management, HeFei University of Technology, China
Osamah Ibrahim Khalaf, Al-Nahrain University - College of Information Engineering, Iraq
Xueshi Dong, Wuhan University, China
W. S. Jin, Beijing University of Technology, China
LeSheng Jin, Nanjing Normal University, China